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Equipment | |
Model No. | |
Capability | |
Example of Analysis and Measurement | |
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XRFS: Wavelength dispersive X-ray fluorescence spectrometer [PIC] |
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RIX-3000 | |
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Elemental analysis (B to U); Component determination using fundamental parameter Method |
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Quantitative analysis (ceramics, thin film , plastics, metals); Qualitative analysis |
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XRD: X-ray diffracto- meter [PIC] |
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RAD-C | |
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Powder X-ray diffractometry; Thin film X-ray diffractometry |
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Qualitative analysis; Analysis of state (crystallinity, amorphous state, crystal lattice) |
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EPMA: Electron probe micro analyzer [PIC] |
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EPMA-8750QH | |
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Microprobe analysis (1 to 3  m, 0.01%order);Elemental analysis (B to U); Image mapping |
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Local analysis; Grain boundary analysis; Segregation analysis of crystalline; Analysis of corrosion products, particulate contaminations and etc. |
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SEM-EDX: Scanning electron microscope applied Energy dispersive X-ray fluorescence spectrometer [PIC] |
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DX4-Superscan 330 | |
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Max. sample size 200mm  ;Magnifying power (X15 to X20,000); Elemental analysis (B to U; 0.1% order); Image mapping |
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Fractography test; Local analysis; Surface examination; Analysis of corrosion products, particulate contaminations and etc. |
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ICP-AES: Inductively coupled plasma optical emission spectrometer |
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ICPS-8100 | |
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Sequential scanning type; Measurement wavelength 160 to 750nm |
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Elemental analysis in sample solution (mg /L) |
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AAS: Atomic Absorption Spectrometer | |
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A-1800 & GA-3 | |
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Measurement wavelength 190 to 900nm; Air-acetylene flame atomic absorption spectrometry; Flameless atomic absorption spectrometry |
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Elemental analysis in sample solution ( g tomg/L); Quantitative analysis of alkali metals |
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FT-IR: Fourier transform infrared spectro- photometer applied infrared microscope [PIC] |
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Nexus 470, | |
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Accessories: Variable angle specular reflectance, Single bounce attenuated total reflectance and Diffuse reflectance |
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Analysis of organic compounds (rubber, plastics, oil, grease, adhesive, surface active agent, etc.); Microprobeanalysis of contamination |
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Contin um |
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TA: Thermoana- lyzer |
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DSC 8230 | |
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DSC(Differential scanning calorimeter; -50  to 750) |
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Calorimetry of crystalli- zation, decomposition, formation, reaction, solidification and etc. |
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TG-DTA 8120 | |
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TG-DTA(Thermogravime- ter Differential thermal analyzer; room temp. to 1500 ) |
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Analysis of glass transition point, softening point, melting point, etc. |
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TMA 8310 | |
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TMA (Thermomechanical analyzer; room temp to 1500 ) |
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Thermodilatometry of ceramics, plastics and metals |
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HPLC: High performance liquid chromato- graph |
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655-12 | |
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Detector: UV-detector, Differential refractometer and Electric conductivity detector |
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Anion-chromatography (mg /L); Gel permeation chromatography | |
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GC: Gas chromato- graph |
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G-3000 | |
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Detector: TCD and FID. Column: glass, metal and G-column. Accessory: Curie point pyrolyser (JHP-2) |
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Purity test of solvent; Pyrolysis gas chromato- graphy of polymer |
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SPM: Scanning probe microscope [PIC] |
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Nano Scope  a |
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AFM: Atomic force microscopy. MFM: Magnetic force microscopy |
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Surface roughness (nm order); Examination of magnetic bit pattern |
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Ultraviolet and visible spectro- photometer [PIC] |
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U-4000 | |
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Scanning wavelength 240 to 2600nm; Accessories: 60 integrating sphere, 5 mirror reflection and 45mirror reflection |
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Molecular absorption spectrophotometry; Turbidimetry; Measure- ment of transmittance and reflectance; Color analysis |
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Ellipsometer [PIC] |
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VASE Series | |
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Scanning wavelength 250 to 1700nm; Incident-angle  : 0 to 90; Resolvingpower 0.005 |
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Determine thin film layer thickness and refractive index |
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Others: Electric conductivity meter, pH meter, Oxidation-Reduction potential meter, Abbe refractometer, etc. | |
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